Pattern recognition when feature variables are subject to error
| dc.contributor.author | Das Gupta, Somesh | |
| dc.date.accessioned | 2012-07-30T11:01:14Z | |
| dc.date.available | 2012-07-30T11:01:14Z | |
| dc.date.issued | 1989 | |
| dc.identifier.citation | Sankhya, Seris B , v.51 , no.3, p.287-294 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10263/4501 | |
| dc.language.iso | en | en_US |
| dc.subject | Bayes rule | en_US |
| dc.subject | Features subjected to noise | en_US |
| dc.subject | Effect of noise distribution | en_US |
| dc.title | Pattern recognition when feature variables are subject to error | en_US |
| dc.type | Article | en_US |
