On data depth and distribution-free discriminant analysis using separating surfaces
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Date
2005
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Keywords
Bayes risk, Elliptic symmetry, Generalized U-statistic, Half-space depth, Linear discriminant analysis, Location-shift models, Missclassification rates, Optimal bayes classifier, Quadratic discriminant analysis, Regression depth, Robustness, Vapnik chervonenkis dimension
Citation
Bernoulli, v 11, no. 1, p 1-27