Fixed width confidence interval of P ( X < Y ) in partial sequential sampling scheme

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dc.contributor.authorBandyopadhyay, Uttam
dc.contributor.authorDas, Radhakanta
dc.contributor.authorBiswas, Atanu
dc.date.accessioned2012-11-02T11:25:37Z
dc.date.available2012-11-02T11:25:37Z
dc.date.issued2003
dc.identifier.citationSequential Analysis,v.22,no.1&2,p.75-93en_US
dc.identifier.urihttp://hdl.handle.net/10263/4677
dc.language.isoenen_US
dc.subjectFixed width confidence intervalen_US
dc.subjectPartial sequential sampling schemeen_US
dc.subjectWiener processen_US
dc.subjectAsymptotic relative efficiencyen_US
dc.titleFixed width confidence interval of P ( X < Y ) in partial sequential sampling schemeen_US
dc.typeArticleen_US

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