Studies on isomorphic-redundancy and testing of non-scan sequential circuits

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dc.contributor.authorDas, Jaydeep
dc.date.accessioned2011-06-10T07:48:49Z
dc.date.available2011-06-10T07:48:49Z
dc.date.issued1992
dc.descriptionM Techen_US
dc.description.sponsorshipGuide: Bhargab B Bhattacharyaen_US
dc.identifier.citation42p.en_US
dc.identifier.urihttp://hdl.handle.net/10263/2189
dc.language.isoenen_US
dc.publisherIndian Statistical Instituteen_US
dc.relation.ispartofseries;Diss-7
dc.subjectIsomorphic redundancyen_US
dc.subjectNon-scan sequential circuitsen_US
dc.titleStudies on isomorphic-redundancy and testing of non-scan sequential circuitsen_US
dc.typeThesisen_US

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