Mapping symmetric functions to hiererchical modules for path-delay fault testability

dc.contributor.authorRahaman, H
dc.contributor.authorDas, D K
dc.contributor.authorBhattacharya, Bhargab B
dc.contributor.authorDas, S K
dc.date.accessioned2011-09-19T11:24:20Z
dc.date.available2011-09-19T11:24:20Z
dc.date.issued2006
dc.identifier.citationJournal of electronic testing - theory and applicationsV22,2,P125-142en_US
dc.identifier.urihttp://hdl.handle.net/10263/2575
dc.language.isoenen_US
dc.subjectSymmetric functionsen_US
dc.subjectHierarchicalen_US
dc.titleMapping symmetric functions to hiererchical modules for path-delay fault testabilityen_US
dc.typeArticleen_US

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