Optimal tests of no contamination in reliability models

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dc.contributor.authorSengupta, A
dc.contributor.authorPal, Chandranath
dc.date.accessioned2012-05-07T18:41:03Z
dc.date.available2012-05-07T18:41:03Z
dc.date.issued2000
dc.identifier.citationLifetime data analysis,V6,P281-290en_US
dc.identifier.urihttp://hdl.handle.net/10263/3851
dc.language.isoenen_US
dc.subjectContamination modelen_US
dc.subjectOptimal testsen_US
dc.subjectPivotal parametricen_US
dc.subjectReliability distributionen_US
dc.titleOptimal tests of no contamination in reliability modelsen_US
dc.typeArticleen_US

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