Data depth and distribution-free discriminant analysis using separating surfaces
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Date
2005
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Bayes risk, Elliptic symmetry, Generalized U statistics, Half-space depth, Linear discriminant analysis, Location shift models, Misclassification rates, Optimal bayes classifier, Quadratic discriminant analysis, Regression depth, Robustness, Vapnik chervonenkis dimension
Citation
Bemoulli,V11,P1-27