On the detection of missing gate faults in reversible circuits by a universal test set

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Binder10.pdf (1.33 MB)

Date

2008

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Keywords

Missing gate faults, Quantum computing, Reversible logic, Testable design, Universal test set

Citation

Proceedings of 21st international conference on VLSI design,P163-168

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http://hdl.handle.net/10263/2493

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Computer Science

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