Optimum sampling plan for detection of independent defect categories in case of defect inteference

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dc.contributor.authorDutta, Tridib K
dc.contributor.authorMukherjee, S P
dc.date.accessioned2014-03-27T12:59:24Z
dc.date.available2014-03-27T12:59:24Z
dc.date.issued1997
dc.identifier.citationIAPQR Transactions, v 22, no 1, p 63-80en_US
dc.identifier.urihttp://hdl.handle.net/10263/5874
dc.language.isoenen_US
dc.subjectOptimum sampling planen_US
dc.subjectDefect inteferenceen_US
dc.subjectDetection of independent defect categoriesen_US
dc.titleOptimum sampling plan for detection of independent defect categories in case of defect inteferenceen_US
dc.typeArticleen_US

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